Continued Pursuit of Perfection.
The APT-2400F series is a high-performance flying probe test system with 4 heads and 6 flying probes. It accurately contacts the extremely small pads on miniaturized PCBs, conducting tests in a short time. With an advanced measurement system and a wide range of testing functions, it significantly improves test coverage and helps detect assembly defects and perform failure analysis that were previously difficult to identify. Offering various models for large PCB and automated testing, the APT-2400F series reduces testing costs from prototyping to mass production while enhancing assembly quality.
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| Model | Standard Size | Large Size | |||
|---|---|---|---|---|---|
|
APT-2400F |
APT-2400F-A |
APT-2400F-SL |
APT-2400F-SL-A |
||
| In-line system | -- | Support In-line | -- | Support In-line | |
| Probes | Top*1 | 4 tilted contact probes, 2 vertical contact probes, 2 IC-open test probes | |||
| Bottom | 3 fixed vertical contact probes with magnet base | ||||
| Testable PCB | Size (L×W) | 540mm(21") × 483mm(19") |
540mm(21") 890mm(35") |
635mm(25") × 610mm(24") |
635mm(25") 985mm(38.7") |
| Thickness | 6.35mm (0.25") | 12.7mm (0.5") | 6.35mm (0.25") | ||
| Weight | 5Kgs (11 lbs) | 15Kgs (33 lbs) | |||
| Component height | Top | 60mm | |||
| Bottom*3 | 120mm | ||||
| Component-free area | Top | 3mm | |||
| Bottom | 3mm | 7mm | |||
| Test time *4 | Single test | 0.05~0.06sec. / step | 0.07~0.08sec. / step | ||
| Combination test | 0.02~0.03sec. / step | 0.03~0.04sec. / step | |||
| Positioning repeatability of flying pribes(XY) *5 | ±25μm | ||||
| Minimum pad size for flying probe *5 | 50μm | ||||
| Minimum pad pitch for flying probe | 150μm | ||||
Notes:
*1 Dual vertical Z-axis equipped.
*2 Divided PCB test function required.
*3 PCB thickness included.
*4 XY 2.5mm pitch movement.
*5 In high precision mode with high accuracy needle probe used.
